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Unintentionally doped high resistivity GaN layers with an InGaN interlayer grown by MOCVD
Liu, J. X.; H. W. Liang; B. H. Li; Y. Liu; X. C. Xia; H. L. Huang; Q. A. Sandhu; R. S. Shen; Y. M. Luo and G. T. Du
2016
发表期刊Rsc Advances
卷号6期号:65
摘要A novel method for finding the initial structure parameters of an optical system via the genetic algorithm (GA) is proposed in this research. Usually, optical designers start their designs from the commonly used structures from a patent database; however, it is time consuming to modify the patented structures to meet the specification. A high-performance design result largely depends on the choice of the starting point. Accordingly, it would be highly desirable to be able to calculate the initial structure parameters automatically. In this paper, a method that combines a genetic algorithm and aberration analysis is used to determine an appropriate initial structure of an optical system. We use a three-mirror system as an example to demonstrate the validity and reliability of this method. On-axis and off-axis telecentric three mirror systems are obtained based on this method. (C) 2015 Elsevier B.V. All rights reserved.
文章类型期刊
收录类别SCI ; EI
语种英语
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/57078
专题中科院长春光机所知识产出
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GB/T 7714
Liu, J. X.,H. W. Liang,B. H. Li,et al. Unintentionally doped high resistivity GaN layers with an InGaN interlayer grown by MOCVD[J]. Rsc Advances,2016,6(65).
APA Liu, J. X..,H. W. Liang.,B. H. Li.,Y. Liu.,X. C. Xia.,...&Y. M. Luo and G. T. Du.(2016).Unintentionally doped high resistivity GaN layers with an InGaN interlayer grown by MOCVD.Rsc Advances,6(65).
MLA Liu, J. X.,et al."Unintentionally doped high resistivity GaN layers with an InGaN interlayer grown by MOCVD".Rsc Advances 6.65(2016).
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