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Effect of deposition temperature on the structural and surface properties of AlN by plasma enhanced atomic layer deposition
Chen, F.; X. Fang; S. Wang; S. Niu; F. Fang; D. Fang; J. Tang; X. Wang; G. Liu and Z. Wei
2016
发表期刊Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering
卷号45期号:4
摘要The influence of growth temperature on the properties of aluminum nitride (AlN) films are grown by plasma enhanced atomic layer deposition (PEALD) at different deposition temperature. NH3 and trimethylaluminum (TMA) were used as precursors, 200, 500, 800, 1000, 1500 cycles AlN layers were deposited at 300, 350 and 370, the growth rate, crystallinity and surface roughness were discussed. Deposition rate and crystallization of the films increased whereas the surface roughness decreased in the growth temperature range of 300-370. 2016, Editorial Board of Journal of Infrared and Laser Engineering. All right reserved.
文章类型期刊
收录类别EI
语种中文
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/56861
专题中科院长春光机所知识产出
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Chen, F.,X. Fang,S. Wang,et al. Effect of deposition temperature on the structural and surface properties of AlN by plasma enhanced atomic layer deposition[J]. Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering,2016,45(4).
APA Chen, F..,X. Fang.,S. Wang.,S. Niu.,F. Fang.,...&G. Liu and Z. Wei.(2016).Effect of deposition temperature on the structural and surface properties of AlN by plasma enhanced atomic layer deposition.Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering,45(4).
MLA Chen, F.,et al."Effect of deposition temperature on the structural and surface properties of AlN by plasma enhanced atomic layer deposition".Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering 45.4(2016).
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