Dual-order overlapped Offner imaging spectrometer in middle- and long- wave infrared regions

	Dual-order overlapped Offner imaging spectrometer in middle- and long- wave infrared regions
	Zhang, H.; W. Fang; X. Ye; M. Jiang and B.-Q. Song
	2015
发表期刊	Guangxue Jingmi Gongcheng/Optics and Precision Engineering
卷号	23 期号:4 页码:965-974
摘要	An Offner imaging spectrometer based on Infrared Focal Plane Arrays(IR FPAs) operated in two common-path diffraction orders was proposed to extend the spectrometer wavelength coverage. The overlapped rays from the first order and the second order of convex grating could be naturally separated and simultaneously detected by the dual-band IR FPAs on the focal plane. The basic principles and design cautions were discussed in detail. Through geometrical ray tracing, the spectral smile and keystone were evaluated. Based on Huygens Point Spread Function(PSF), the Spectral Response Function (SRF) was also simulated, from which the spectral bandpass was derived as well. The dual-band Offner imaging spectrometer covers the wavelength range of 3 to 6 m in the second order and 6 to 12 m in the first order with bandpasses of 13.2-14.3 nm and 28.3-33.3 nm respectively. The two diffraction orders have the same spectral smile and keystone characteristics by both within half of a pixel width. The grating efficiencies are not lower than 20% over the full wavelength ranges. For its compact construction and wide spectral coverage, the instrument is competent for the measurements of the earth surface or deep space objects in the middle- and long- wave infrared (MWIR/LWIR) regions with moderate resolutions. , 2015, Chinese Academy of Sciences. All right reserved.
文章类型	期刊论文
收录类别	EI
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/56135
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Zhang, H.,W. Fang,X. Ye,et al. Dual-order overlapped Offner imaging spectrometer in middle- and long- wave infrared regions[J]. Guangxue Jingmi Gongcheng/Optics and Precision Engineering,2015,23(4):965-974.
APA	Zhang, H.,W. Fang,X. Ye,&M. Jiang and B.-Q. Song.(2015).Dual-order overlapped Offner imaging spectrometer in middle- and long- wave infrared regions.Guangxue Jingmi Gongcheng/Optics and Precision Engineering,23(4),965-974.
MLA	Zhang, H.,et al."Dual-order overlapped Offner imaging spectrometer in middle- and long- wave infrared regions".Guangxue Jingmi Gongcheng/Optics and Precision Engineering 23.4(2015):965-974.

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