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Radiometric calibration method for large aperture infrared system with broad dynamic range
Sun, Z. Y.; S. T. Chang and W. Zhu
2015
发表期刊Applied Optics
卷号54期号:15页码:4659-4666
摘要Infrared radiometric measurements can acquire important data for missile defense systems. When observation is carried out by ground-based infrared systems, a missile is characterized by long distance, small size, and large variation of radiance. Therefore, the infrared systems should be manufactured with a larger aperture to enhance detection ability and calibrated at a broader dynamic range to extend measurable radiance. Nevertheless, the frequently used calibration methods demand an extended-area blackbody with broad dynamic range or a huge collimator for filling the system's field stop, which would greatly increase manufacturing costs and difficulties. To overcome this restriction, a calibration method based on amendment of inner and outer calibration is proposed. First, the principles and procedures of this method are introduced. Then, a shifting strategy of infrared systems for measuring targets with large fluctuations of infrared radiance is put forward. Finally, several experiments are performed on a shortwave infrared system with Phi 400 mm aperture. The results indicate that the proposed method cannot only ensure accuracy of calibration but have the advantage of low cost, low power, and high motility. Hence, it is an effective radiometric calibration method in the outfield. (C) 2015 Optical Society of America
收录类别SCI ; EI
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/55389
专题中科院长春光机所知识产出
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Sun, Z. Y.,S. T. Chang and W. Zhu. Radiometric calibration method for large aperture infrared system with broad dynamic range[J]. Applied Optics,2015,54(15):4659-4666.
APA Sun, Z. Y.,&S. T. Chang and W. Zhu.(2015).Radiometric calibration method for large aperture infrared system with broad dynamic range.Applied Optics,54(15),4659-4666.
MLA Sun, Z. Y.,et al."Radiometric calibration method for large aperture infrared system with broad dynamic range".Applied Optics 54.15(2015):4659-4666.
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