CCD plays an important role in the field of science such as machine vision and space remote sensing, to a certain extent, its performances determine the application performances of the whole system. When testing direct at aerospace-grade CCD in practical application, found some methods have only stay in the test standard level and the testing system was not universality. Therefore, based on the study of CCD photoelectric parameter test method and the corresponding description of the test procedures, a set of universal test system was designed to realize the accurate measurement of CCD performance.
Firstly, based on the research of the 3D noise in the CCD chip, this paper analyzing the test method of photoelectric-response parameters including response non-uniform, signal-to-noise ratio, and also the test method of spectral-response including relative spectral responsivity and the peak wavelength. Meanwhile, giving the corresponding description of the test procedures.
Secondly, on the foundation of the theoretical analysis, an automatic test system was designed used for photoelectric parameters testing of CCD. Radiation light source is brightness-controlled with constant color temperature according to the double integrating sphere system. Monochromatic source achieves the monochromatic wavelength output with high resolution. The designing of the host computer software is guided by the principle that top-down’s frame structure and bottom-up’s modular implementation. The control software is developed with the VB.NET assembled with MATLAB language. The additional test suggests that the irradiance uniformity is superior to 0.87% in the center area(40mm×40mm) of the double integrating sphere which can meet the application requirements well.
Finally, take the SONY ICX 285 plane array CCD for example, applied two noise extraction algorithm to calculate the signal-to-noise ratio and afterward validated theoretically. Based on the method of monochromator, the spectral response of plane array CCD is tested and then evaluating the uncertainty of the results in all respects. And then the noise and other photoelectric parameters are tested.
修改评论