CCD光电参数测试方法研究及系统设计

	CCD光电参数测试方法研究及系统设计
	李晓杰
学位类型	硕士
导师	任建伟
	2014-11
学位授予单位	中国科学院大学
学位专业	光学
关键词	辐射测量 Ccd 3d噪声光电响应光谱响应
摘要	CCD在机器视觉，空间遥感等众多领域充当了核心角色，其性能在很大程度上决定了整个系统的应用性能。实际应用中针对航天级CCD进行性能测试时，发现已有的测试方法只是停留在测试标准层面，测试系统也不具有通用性。因此，本文在研究CCD光电参量测试方法并对测试流程进行相应描述的基础上，搭建了一套通用的测试系统，实现对CCD芯片光电参数的精确测试。首先，在研究CCD芯片3D噪声的基础上，分析了包括光响应非均匀、信噪比等光电响应参数测试方法和包括相对光谱响应度、峰值波长等光谱响应参数测试方法，并对测试流程进行了相应的描述。在此基础上，设计了一套通用的CCD光电参数测试系统。辐射光源设计为双积分球等色温连续调光系统，单色光源实现了200-2500nm宽波段高分辨率单色波长输出；测试软件以自上而下整体设计+自下而上分模块实现设计理念为指导，采用VB.NET+Matlab语言混合编写而成；经测试，辐射光源中心40mm×40mm区域辐照度均匀性达到了0.87%，满足应用需求。最后，以SONY ICX 285面阵CCD芯片为例，应用两种噪声提取算法计算了信噪比，并进行理论验证；采用单色仪法进行光谱响应参数测试，并建立不确定度评估模型对测试结果的不确定度进行全面评估；另外还对上述噪声以及其他光电参量进行了测试。
其他摘要	CCD plays an important role in the field of science such as machine vision and space remote sensing, to a certain extent, its performances determine the application performances of the whole system. When testing direct at aerospace-grade CCD in practical application, found some methods have only stay in the test standard level and the testing system was not universality. Therefore, based on the study of CCD photoelectric parameter test method and the corresponding description of the test procedures, a set of universal test system was designed to realize the accurate measurement of CCD performance. Firstly, based on the research of the 3D noise in the CCD chip, this paper analyzing the test method of photoelectric-response parameters including response non-uniform, signal-to-noise ratio, and also the test method of spectral-response including relative spectral responsivity and the peak wavelength. Meanwhile, giving the corresponding description of the test procedures. Secondly, on the foundation of the theoretical analysis, an automatic test system was designed used for photoelectric parameters testing of CCD. Radiation light source is brightness-controlled with constant color temperature according to the double integrating sphere system. Monochromatic source achieves the monochromatic wavelength output with high resolution. The designing of the host computer software is guided by the principle that top-down’s frame structure and bottom-up’s modular implementation. The control software is developed with the VB.NET assembled with MATLAB language. The additional test suggests that the irradiance uniformity is superior to 0.87% in the center area(40mm×40mm) of the double integrating sphere which can meet the application requirements well. Finally, take the SONY ICX 285 plane array CCD for example, applied two noise extraction algorithm to calculate the signal-to-noise ratio and afterward validated theoretically. Based on the method of monochromator, the spectral response of plane array CCD is tested and then evaluating the uncertainty of the results in all respects. And then the noise and other photoelectric parameters are tested.
语种	中文
文献类型	学位论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/44665
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	李晓杰. CCD光电参数测试方法研究及系统设计[D]. 中国科学院大学,2014.

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