Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver

	Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver
	Zhao J.; Gao J.; Deng Y.; Liu H.; Wang X.
	2014
发表期刊	Aip Advances
ISSN	ISBN/2158-3226
卷号	4 期号:4 页码:7
摘要	For planar structured hyperbolic metamaterial, the shortest wavelength achievable for negative refraction is often limited by dielectric layers, which are usually wide band gap semiconductors that absorb light strongly at wavelength shorter than their absorption edge. Here we proposed that using SiO2 may break such limitation based on effective medium theory. Through calculation and simulation we demonstrated broad angle negative refraction by a planar Ag/SiO2 layered structure at wavelength down to 326 nm. Its imaging and focusing abilities were also presented. The lower limit of wavelength here is defined by the property of silver, whose permittivity turns positive below 324 nm. (C) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
收录类别	SCI ; EI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/44187
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Zhao J.,Gao J.,Deng Y.,et al. Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver[J]. Aip Advances,2014,4(4):7.
APA	Zhao J.,Gao J.,Deng Y.,Liu H.,&Wang X..(2014).Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver.Aip Advances,4(4),7.
MLA	Zhao J.,et al."Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver".Aip Advances 4.4(2014):7.

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