Development of measurement instrument for photoelectric parameters of CCD

	Development of measurement instrument for photoelectric parameters of CCD
	Zhou Y.; Yan F.; Zhang M.
	2014
发表期刊	Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering
ISSN	ISBN/10072276
卷号	43 期号:10 页码:3451-3456
摘要	A measurement system for testing the photoelectric parameters of CCD was developed. It can realize automatic testing for the photoelectric parameters of various types of linear or area CCD, including invalid pixels, relative spectral responsivity, saturation irradiance, responsivity, equivalent noise irradiance, dynamic range, linearity, threshold illuminance, nonuniformity. The measurement system for relative spectral responsivity of CCD was based on the method of direct comparison of single optic path. The other parameters measurement system was built on a special designed integrating sphere light source. Four halogen lights was plant in four secondary integrating spheres, then cascaded with main integrating sphere using high-precision electric diaphragm. After calibrated, the light meter planted on the wall of main integrating sphere can test the luminance of export in real-time. The color temperature of the light source unchanged, the luminance of export was uniform, and can adjust in a large dynamic range continuously. The demand of testing the photoelectric parameters of CCD was satisfied. The photoelectric parameters of CCD47-10B was tested, and then the uncertainty of those systems was analyzed. Results indicate that the spectrum range of measurement system of relative spectral responsivity is 400-1000 nm, the uncertainty is 4.37%. At the distance of 23 mm from exit port of source in measurement system for photoelectric transform parameters of CCD, the dynamic range of luminance was 0-235 lx, and the irradiance uniformity within 80 mm has reached 99%, the uncertainty is 4.9%. The measurement system can be used in testing the photoelectric parameters of aerospace-grade CCD and filtering it.
收录类别	EI
语种	中文
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/43890
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Zhou Y.,Yan F.,Zhang M.. Development of measurement instrument for photoelectric parameters of CCD[J]. Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering,2014,43(10):3451-3456.
APA	Zhou Y.,Yan F.,&Zhang M..(2014).Development of measurement instrument for photoelectric parameters of CCD.Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering,43(10),3451-3456.
MLA	Zhou Y.,et al."Development of measurement instrument for photoelectric parameters of CCD".Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering 43.10(2014):3451-3456.

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