CIOMP OpenIR  > 中科院长春光机所知识产出
光谱共焦位移传感器测量透明材料厚度的应用
朱万彬
2011-09-20
Source Publication光机电信息
ISSN1007-1180
Volume28Issue:9Pages:50-53
Document Type期刊论文
Identifierhttp://ir.ciomp.ac.cn/handle/181722/3670
Collection中科院长春光机所知识产出
Recommended Citation
GB/T 7714
朱万彬. 光谱共焦位移传感器测量透明材料厚度的应用[J]. 光机电信息,2011,28(9):50-53.
APA 朱万彬.(2011).光谱共焦位移传感器测量透明材料厚度的应用.光机电信息,28(9),50-53.
MLA 朱万彬."光谱共焦位移传感器测量透明材料厚度的应用".光机电信息 28.9(2011):50-53.
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