A NEW METHOD FOR MEASURING REFRACTIVE-INDEX AND THICKNESS OF LANGMUIR-BLODGETT FILMS OF TTB-PCSICL2

	A NEW METHOD FOR MEASURING REFRACTIVE-INDEX AND THICKNESS OF LANGMUIR-BLODGETT FILMS OF TTB-PCSICL2
	Li Y. J.; Wang X. X.; Pang X. M.; Hua Y. L.; Fan J. Q.
	1989
发表期刊	Thin Solid Films
ISSN	0040-6090
卷号	178 页码:525-528
收录类别	SCI
语种	英语
WOS记录号	WOS:A1989CF47500070
引用统计
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/34245
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Li Y. J.,Wang X. X.,Pang X. M.,et al. A NEW METHOD FOR MEASURING REFRACTIVE-INDEX AND THICKNESS OF LANGMUIR-BLODGETT FILMS OF TTB-PCSICL2[J]. Thin Solid Films,1989,178:525-528.
APA	Li Y. J.,Wang X. X.,Pang X. M.,Hua Y. L.,&Fan J. Q..(1989).A NEW METHOD FOR MEASURING REFRACTIVE-INDEX AND THICKNESS OF LANGMUIR-BLODGETT FILMS OF TTB-PCSICL2.Thin Solid Films,178,525-528.
MLA	Li Y. J.,et al."A NEW METHOD FOR MEASURING REFRACTIVE-INDEX AND THICKNESS OF LANGMUIR-BLODGETT FILMS OF TTB-PCSICL2".Thin Solid Films 178(1989):525-528.