Simplified high-electric-field technique for measuring the liquid crystal anchoring strength

	Simplified high-electric-field technique for measuring the liquid crystal anchoring strength
	Yokoyama H.; Sun R. P.
	2000
发表期刊	Japanese Journal of Applied Physics Part 2-Letters
ISSN	0021-4922
卷号	39 期号:1AB 页码:L45-L47
摘要	A simple passive approach, employing a small current-regulating capacitor connected in series with a liquid crystal cell, is proposed and its utility demonstrated as a new scheme of implementing the high-electric-field technique (HEFT) for determining the surface anchoring strength of liquid crystals. The series capacitor removes the cumbersome need for measuring the cell capacitance at high fields from the HEFT, thereby drastically simplifying the operation. The simplified HEFT allows a direct linear relation between the optical phase retardation and the reciprocal of the applied voltage, and as in the original HEFT, the linear extrapolation of this relationship to infinite voltage provides the anchoring strength.
收录类别	SCI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/34109
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Yokoyama H.,Sun R. P.. Simplified high-electric-field technique for measuring the liquid crystal anchoring strength[J]. Japanese Journal of Applied Physics Part 2-Letters,2000,39(1AB):L45-L47.
APA	Yokoyama H.,&Sun R. P..(2000).Simplified high-electric-field technique for measuring the liquid crystal anchoring strength.Japanese Journal of Applied Physics Part 2-Letters,39(1AB),L45-L47.
MLA	Yokoyama H.,et al."Simplified high-electric-field technique for measuring the liquid crystal anchoring strength".Japanese Journal of Applied Physics Part 2-Letters 39.1AB(2000):L45-L47.

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