Changchun Institute of Optics,Fine Mechanics and Physics,CAS
Structural and electrical characterizations of single tetragonal FeSe on Si substrate | |
其他题名 | 论文其他题名 |
Wu X. J.; Zhang Z. Z.; Zhang J. Y.; Ju Z. G.; Shen D. Z.; Li B. H.; Shan C. X.; Lu Y. M. | |
2007 | |
发表期刊 | Journal of Crystal Growth |
ISSN | 0022-0248 |
卷号 | 300期号:2页码:483-485 |
摘要 | (001)-Oriented FeSe thin films were successfully fabricated by metal organic chemical vapor deposition on Si substrate with large thermal mismatch. X-ray diffraction and X-ray photoelectron spectroscopy measurements indicate that the films are of single tetragonal phase FeSe. Hysteresis loop indicates that the FeSe structure is ferromagnetic at room temperature with coercive force of 260Oe. The FeSe films show p-type conduction with carrier concentration of 10(21) cm(-3), and the anomalous Hall effect was discussed. (c) 2007 Elsevier B.V. All rights reserved. |
收录类别 | SCI ; EI |
语种 | 英语 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/26659 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Wu X. J.,Zhang Z. Z.,Zhang J. Y.,et al. Structural and electrical characterizations of single tetragonal FeSe on Si substrate[J]. Journal of Crystal Growth,2007,300(2):483-485. |
APA | Wu X. J..,Zhang Z. Z..,Zhang J. Y..,Ju Z. G..,Shen D. Z..,...&Lu Y. M..(2007).Structural and electrical characterizations of single tetragonal FeSe on Si substrate.Journal of Crystal Growth,300(2),483-485. |
MLA | Wu X. J.,et al."Structural and electrical characterizations of single tetragonal FeSe on Si substrate".Journal of Crystal Growth 300.2(2007):483-485. |
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