Changchun Institute of Optics,Fine Mechanics and Physics,CAS
Improved field emission characteristic of carbon nanotubes by an Ag micro-particle intermediation layer | |
其他题名 | 论文其他题名 |
Lu W. H.; Song H.; Jin Y. X.; Zhao H. F.; Li Z. M.; Jiang H.; Miao G. Q. | |
2008 | |
发表期刊 | Microelectronics Journal |
ISSN | 0026-2692 |
卷号 | 39期号:5页码:782-785 |
摘要 | An efficient way to improve field emission characteristic of carbon nanotubes (CNTs) through an Ag micro-particle intermediation layer is presented. In this way, the intermediation layer is deposited on an indium tin oxide glass substrate by electrochemical method and then the CNTs are covered onto surface of the intermediation layer by electrophoretic method as CNT field emitters. The field emission characteristic of the CNT field emitters with the intermediation layer is significantly improved compared to the one without the intermediation layer, including decreased turn-on electric field from 4.2 to 3.1 V/mu m and increased emission current density from 0.224 to 0.912 mA/cm(2) at an applied electric field of 6V/mu m. The improved field emission characteristic may be attributed to gibbous surface of the CNT field emitters. This efficient way is much simple, low cost, and suitable for production of large scale CNTs-based field emission cold cathode. (C) 2007 Elsevier Ltd. All rights reserved. |
收录类别 | SCI ; EI |
语种 | 英语 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/26492 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Lu W. H.,Song H.,Jin Y. X.,et al. Improved field emission characteristic of carbon nanotubes by an Ag micro-particle intermediation layer[J]. Microelectronics Journal,2008,39(5):782-785. |
APA | Lu W. H..,Song H..,Jin Y. X..,Zhao H. F..,Li Z. M..,...&Miao G. Q..(2008).Improved field emission characteristic of carbon nanotubes by an Ag micro-particle intermediation layer.Microelectronics Journal,39(5),782-785. |
MLA | Lu W. H.,et al."Improved field emission characteristic of carbon nanotubes by an Ag micro-particle intermediation layer".Microelectronics Journal 39.5(2008):782-785. |
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