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Ultraviolet Schottky detector based on epitaxial ZnO thin film
其他题名论文其他题名
Jiang D. Y.; Zhang J. Y.; Lu Y. M.; Liu K. W.; Zhao D. X.; Zhang Z. Z.; Shen D. Z.; Fan X. W.
2008
发表期刊Solid-State Electronics
ISSN0038-1101
卷号52期号:5页码:679-682
摘要In this paper, we have prepared Schottky type ZnO metal-semiconductor-metal (MSM) ultraviolet (UV) detector. The structural, electrical, and optical measurements were carried out. The detector exhibited a peak responsivity of 0.337 A/W at 360 nm and the dark current was about 1 nA under 3 V bias. An ultraviolet-visible rejection ratio was obtained about more than four orders of magnitude from the fabricated detector. The 10 - 90% rise and fall time were 20 ns and 250 ns, respectively. We proposed that the detector had shown a gain, which was attributed to the trapping of hole carriers at the semiconductor-metal interface. (c) 2007 Elsevier Ltd. All rights reserved.
收录类别SCI ; EI
语种英语
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/26452
专题中科院长春光机所知识产出
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Jiang D. Y.,Zhang J. Y.,Lu Y. M.,et al. Ultraviolet Schottky detector based on epitaxial ZnO thin film[J]. Solid-State Electronics,2008,52(5):679-682.
APA Jiang D. Y..,Zhang J. Y..,Lu Y. M..,Liu K. W..,Zhao D. X..,...&Fan X. W..(2008).Ultraviolet Schottky detector based on epitaxial ZnO thin film.Solid-State Electronics,52(5),679-682.
MLA Jiang D. Y.,et al."Ultraviolet Schottky detector based on epitaxial ZnO thin film".Solid-State Electronics 52.5(2008):679-682.
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