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Effect of buffer growth temperature on crystalline quality and optical property of In0.82Ga0.18As/InP grown by LP-MOCVD
其他题名论文其他题名
Zhang T.; Miao G. Q.; Jin Y. X.; Jiang H.; Li Z. M.; Song H.
2008
发表期刊Journal of Alloys and Compounds
ISSN0925-8388
卷号458期号:1—2页码:363-365
摘要In0.82Ga0.18As epilayers were grown by LP-MOCVD on InP (100) substrates with two-step growth method. It was analyzed that growth temperature of buffer layer exerted an influence on its crystalline quality and optical property, which were characterized by X-ray diffraction, scanning electron microscopy, and photoluminescence. The experiments showed that the crystalline quality and the optical property of the In0.82Ga0.18As epilayers had close relation to the growth temperature of buffer layer and the. optimum buffer's growth temperature was about 450 degrees C. (c) 2007 Elsevier B.V. All rights reserved.
收录类别SCI ; EI
语种英语
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/26449
专题中科院长春光机所知识产出
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GB/T 7714
Zhang T.,Miao G. Q.,Jin Y. X.,et al. Effect of buffer growth temperature on crystalline quality and optical property of In0.82Ga0.18As/InP grown by LP-MOCVD[J]. Journal of Alloys and Compounds,2008,458(1—2):363-365.
APA Zhang T.,Miao G. Q.,Jin Y. X.,Jiang H.,Li Z. M.,&Song H..(2008).Effect of buffer growth temperature on crystalline quality and optical property of In0.82Ga0.18As/InP grown by LP-MOCVD.Journal of Alloys and Compounds,458(1—2),363-365.
MLA Zhang T.,et al."Effect of buffer growth temperature on crystalline quality and optical property of In0.82Ga0.18As/InP grown by LP-MOCVD".Journal of Alloys and Compounds 458.1—2(2008):363-365.
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