Changchun Institute of Optics,Fine Mechanics and Physics,CAS
Valence band offset of ZnO/Zn(0.85)Mg(0.15)O heterojunction measured by x-ray photoelectron spectroscopy | |
其他题名 | 论文其他题名 |
Su S. C.; Lu Y. M.; Zhang Z. Z.; Shan C. X.; Li B. H.; Shen D. Z.; Yao B.; Zhang J. Y.; Zhao D. X.; Fan X. W. | |
2008 | |
发表期刊 | Applied Physics Letters |
ISSN | 0003-6951 |
卷号 | 93期号:8 |
摘要 | X-ray photoelectron spectroscopy was used to measure the valence band offset at the ZnO/Zn(0.85)Mg(0.15)O heterojunction grown by plasma-assisted molecular beam epitaxy. The valence band offset (Delta EV) is determined to be 0.13 eV. According to the experimental band gap of 3.68 eV for the Zn(0.85)Mg(0.15)O, the conduction band offset (Delta EC) in this system was calculated to be 0.18 eV. The Delta Ec: Delta Ev in ZnO/Zn(0.85)Mg(0.15)O heterojunction was estimated to be 3:2. (C) 2008 American Institute of Physics. |
收录类别 | SCI ; EI |
语种 | 英语 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/26363 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Su S. C.,Lu Y. M.,Zhang Z. Z.,et al. Valence band offset of ZnO/Zn(0.85)Mg(0.15)O heterojunction measured by x-ray photoelectron spectroscopy[J]. Applied Physics Letters,2008,93(8). |
APA | Su S. C..,Lu Y. M..,Zhang Z. Z..,Shan C. X..,Li B. H..,...&Fan X. W..(2008).Valence band offset of ZnO/Zn(0.85)Mg(0.15)O heterojunction measured by x-ray photoelectron spectroscopy.Applied Physics Letters,93(8). |
MLA | Su S. C.,et al."Valence band offset of ZnO/Zn(0.85)Mg(0.15)O heterojunction measured by x-ray photoelectron spectroscopy".Applied Physics Letters 93.8(2008). |
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