Valence band offset of ZnO/Zn(0.85)Mg(0.15)O heterojunction measured by x-ray photoelectron spectroscopy

	Valence band offset of ZnO/Zn(0.85)Mg(0.15)O heterojunction measured by x-ray photoelectron spectroscopy
其他题名	论文其他题名
	Su S. C.; Lu Y. M.; Zhang Z. Z.; Shan C. X.; Li B. H.; Shen D. Z.; Yao B.; Zhang J. Y.; Zhao D. X.; Fan X. W.
	2008
发表期刊	Applied Physics Letters
ISSN	0003-6951
卷号	93 期号:8
摘要	X-ray photoelectron spectroscopy was used to measure the valence band offset at the ZnO/Zn(0.85)Mg(0.15)O heterojunction grown by plasma-assisted molecular beam epitaxy. The valence band offset (Delta EV) is determined to be 0.13 eV. According to the experimental band gap of 3.68 eV for the Zn(0.85)Mg(0.15)O, the conduction band offset (Delta EC) in this system was calculated to be 0.18 eV. The Delta Ec: Delta Ev in ZnO/Zn(0.85)Mg(0.15)O heterojunction was estimated to be 3:2. (C) 2008 American Institute of Physics.
收录类别	SCI ; EI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/26363
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Su S. C.,Lu Y. M.,Zhang Z. Z.,et al. Valence band offset of ZnO/Zn(0.85)Mg(0.15)O heterojunction measured by x-ray photoelectron spectroscopy[J]. Applied Physics Letters,2008,93(8).
APA	Su S. C..,Lu Y. M..,Zhang Z. Z..,Shan C. X..,Li B. H..,...&Fan X. W..(2008).Valence band offset of ZnO/Zn(0.85)Mg(0.15)O heterojunction measured by x-ray photoelectron spectroscopy.Applied Physics Letters,93(8).
MLA	Su S. C.,et al."Valence band offset of ZnO/Zn(0.85)Mg(0.15)O heterojunction measured by x-ray photoelectron spectroscopy".Applied Physics Letters 93.8(2008).

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