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Phase stability of cubic Mg0.55Zn0.45O thin film studied by continuous thermal annealing method
其他题名论文其他题名
Ju Z. G.; Shan C. X.; Yang C. L.; Zhang J. Y.; Yao B.; Zhao D. X.; Shen D. Z.; Fan X. W.
2009
发表期刊Applied Physics Letters
ISSN0003-6951
卷号94期号:10
摘要The phase stability of cubic Mg0.55Zn0.45O thin film grown by metal-organic chemical vapor deposition was studied through continuous thermal annealing. The crystal quality and surface smoothness were greatly improved after a continuous thermal annealing at 750 degrees C. It is attributed to the reducing of interstitial Zn by thermal annealing. However, phase segregation occurred when the sample was annealed at a higher temperature (850 degrees C), which is identified from both x-ray diffraction patterns and optical transmission spectra.
收录类别SCI ; EI
语种英语
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/26268
专题中科院长春光机所知识产出
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Ju Z. G.,Shan C. X.,Yang C. L.,et al. Phase stability of cubic Mg0.55Zn0.45O thin film studied by continuous thermal annealing method[J]. Applied Physics Letters,2009,94(10).
APA Ju Z. G..,Shan C. X..,Yang C. L..,Zhang J. Y..,Yao B..,...&Fan X. W..(2009).Phase stability of cubic Mg0.55Zn0.45O thin film studied by continuous thermal annealing method.Applied Physics Letters,94(10).
MLA Ju Z. G.,et al."Phase stability of cubic Mg0.55Zn0.45O thin film studied by continuous thermal annealing method".Applied Physics Letters 94.10(2009).
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