X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset

	X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset
其他题名	论文其他题名
	Deng R.; Yao B.; Li Y. F.; Zhao Y. M.; Li B. H.; Shan C. X.; Zhang Z. Z.; Zhao D. X.; Zhang J. Y.; Shen D. Z.; Fan X. W.
	2009
发表期刊	Applied Physics Letters
ISSN	0003-6951
卷号	94 期号:2
摘要	Valence-band offset (VBO) of n-ZnO/p-NiO heterojunction has been investigated by x-ray photoelectron spectroscopy. Core levels of Zn 2p and Ni 2p were used to align the VBO of n-ZnO/p-NiO heterojunction. It was found that n-ZnO/p-NiO heterojunction has a type-II band alignment and its VBO is determined to be 2.60 +/- 0.20 eV, and conduction-band offset is deduced to be 2.93 +/- 0.20 eV. The experimental VBO value is in good agreement with the calculated value based on the electron affinity of ZnO and NiO.
收录类别	SCI ; EI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/26240
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Deng R.,Yao B.,Li Y. F.,et al. X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset[J]. Applied Physics Letters,2009,94(2).
APA	Deng R..,Yao B..,Li Y. F..,Zhao Y. M..,Li B. H..,...&Fan X. W..(2009).X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset.Applied Physics Letters,94(2).
MLA	Deng R.,et al."X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset".Applied Physics Letters 94.2(2009).

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