Changchun Institute of Optics,Fine Mechanics and Physics,CAS
Contact Properties of Au/Mg0.27Zn0.73O by Different Annealing Processes | |
其他题名 | 论文其他题名 |
Han S.; Zhang J. Y.; Zhang Z. Z.; Wang L. K.; Zhao Y. M.; Zheng J.; Cao J. M.; Yao B.; Zhao D. X.; Shen D. Z. | |
2010 | |
发表期刊 | Journal of Physical Chemistry C |
ISSN | 1932-7447 |
卷号 | 114期号:49页码:21757-21761 |
摘要 | Au contacts were fabricated on Mg0.27Zn0.73O thin films that had been annealed by different processes. For the as-grown and vacuum annealed thin films, the Au/MgZnO contacts show ohmic behavior. For the thin film annealed in vacuum followed by in air, the contact shows current-voltage curve with Schottky characteristics and ultraviolet photo response at 0 V bias. This Schottky contact is attributed to the decrease of grain boundary density during vacuum annealing and the repair of defects during succedent annealing in air. At 5 V bias, the UV/visible (330 nm/440 nm) reject ratio of the Schottky detector reaches 4(circle dot) orders of magnitude, obviously higher than the non-Schottky ones based on the as-grown MgZnO thin films and the vacuum annealed ones. |
收录类别 | SCI ; EI |
语种 | 英语 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/26183 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Han S.,Zhang J. Y.,Zhang Z. Z.,et al. Contact Properties of Au/Mg0.27Zn0.73O by Different Annealing Processes[J]. Journal of Physical Chemistry C,2010,114(49):21757-21761. |
APA | Han S..,Zhang J. Y..,Zhang Z. Z..,Wang L. K..,Zhao Y. M..,...&Shen D. Z..(2010).Contact Properties of Au/Mg0.27Zn0.73O by Different Annealing Processes.Journal of Physical Chemistry C,114(49),21757-21761. |
MLA | Han S.,et al."Contact Properties of Au/Mg0.27Zn0.73O by Different Annealing Processes".Journal of Physical Chemistry C 114.49(2010):21757-21761. |
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