Contact Properties of Au/Mg0.27Zn0.73O by Different Annealing Processes

	Contact Properties of Au/Mg0.27Zn0.73O by Different Annealing Processes
其他题名	论文其他题名
	Han S.; Zhang J. Y.; Zhang Z. Z.; Wang L. K.; Zhao Y. M.; Zheng J.; Cao J. M.; Yao B.; Zhao D. X.; Shen D. Z.
	2010
发表期刊	Journal of Physical Chemistry C
ISSN	1932-7447
卷号	114 期号:49 页码:21757-21761
摘要	Au contacts were fabricated on Mg0.27Zn0.73O thin films that had been annealed by different processes. For the as-grown and vacuum annealed thin films, the Au/MgZnO contacts show ohmic behavior. For the thin film annealed in vacuum followed by in air, the contact shows current-voltage curve with Schottky characteristics and ultraviolet photo response at 0 V bias. This Schottky contact is attributed to the decrease of grain boundary density during vacuum annealing and the repair of defects during succedent annealing in air. At 5 V bias, the UV/visible (330 nm/440 nm) reject ratio of the Schottky detector reaches 4(circle dot) orders of magnitude, obviously higher than the non-Schottky ones based on the as-grown MgZnO thin films and the vacuum annealed ones.
收录类别	SCI ; EI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/26183
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Han S.,Zhang J. Y.,Zhang Z. Z.,et al. Contact Properties of Au/Mg0.27Zn0.73O by Different Annealing Processes[J]. Journal of Physical Chemistry C,2010,114(49):21757-21761.
APA	Han S..,Zhang J. Y..,Zhang Z. Z..,Wang L. K..,Zhao Y. M..,...&Shen D. Z..(2010).Contact Properties of Au/Mg0.27Zn0.73O by Different Annealing Processes.Journal of Physical Chemistry C,114(49),21757-21761.
MLA	Han S.,et al."Contact Properties of Au/Mg0.27Zn0.73O by Different Annealing Processes".Journal of Physical Chemistry C 114.49(2010):21757-21761.

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