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Polarization characteristic of Al+MgF2 film at VUV
其他题名论文其他题名
Liu Y.; Li Z. G.; Li F. T.
2002
发表期刊Spectroscopy and Spectral Analysis
ISSN1000-0593
卷号22期号:5页码:724-727
摘要Polarization characteristic of Al + MgF2 is researched theoretically and experimentally. According to the theory of electromagnetism, the reflectance perpendicular and parallel to the incident plane of, Al + WF2 is calculated in the way of matrix optics. The effect of incident conditions and thickness of MgF2 is considered on the reflectance of Al + MgF2 coatings. The MgF2 not only prevents the oxidation of aluminum but also increases the reflectance of Al + MgF2 by interference. The polarization of Al + MgF2 is analyzed using the concept of ratio of extinction based on above mentioned calculations. The polarization character of Al + MgF2 and single Al coating is compared. The reflectances perpendicular and parallel to the incident plane of Al + MgF2 film are measured at VUV range, using LiF polarizer as a VUV polarizer. So the polarization character of Al + MgF2 is researched experimentally. Both theoretical and experimental results of the polarization character of Al + MgF2 are coincident.
收录类别SCI
语种中文
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/25856
专题中科院长春光机所知识产出
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Liu Y.,Li Z. G.,Li F. T.. Polarization characteristic of Al+MgF2 film at VUV[J]. Spectroscopy and Spectral Analysis,2002,22(5):724-727.
APA Liu Y.,Li Z. G.,&Li F. T..(2002).Polarization characteristic of Al+MgF2 film at VUV.Spectroscopy and Spectral Analysis,22(5),724-727.
MLA Liu Y.,et al."Polarization characteristic of Al+MgF2 film at VUV".Spectroscopy and Spectral Analysis 22.5(2002):724-727.
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