A study on photoluminescence characterization of high-quality nanocrystalline ZnO thin films

	A study on photoluminescence characterization of high-quality nanocrystalline ZnO thin films
其他题名	论文其他题名
	Zhang X. T.; Xiao Z. Y.; Zhang W. L.; Gao H.; Wang Y. X.; Liu Y. C.; Zhang Y. J.; Xu W.
	2003
发表期刊	Acta Physica Sinica
ISSN	1000-3290
卷号	52 期号:3 页码:740-744
摘要	In this paper, we report the photoluminescence from high-quality nanocrystalline ZnO thin films. The high-quality nanocrystalline ZnO thin films are prepared by thermal oxidation of ZnS films at 800degreesC, which are deposited by low-pressure metal-organic chemical vapor deposition technique. X-ray diffraction indicated that the nanocrystalline ZnO thin films have a polycrystalline hexagonal wurtzite structure. A strong ultraviolet emission peak at 3.26 eV was observed and the deep-level emission band was barely observable at room temperature. The strength ( Gamma(LO)) of the exciton-longitudinal-optical ( LO) -phonon coupling is deduced from the temperature dependence of the full width at half maximum of the fundamental excitonic peak. Gamma(LO) is reduced greatly due to the quantum confinement effect.
收录类别	SCI
语种	中文
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/25827
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Zhang X. T.,Xiao Z. Y.,Zhang W. L.,et al. A study on photoluminescence characterization of high-quality nanocrystalline ZnO thin films[J]. Acta Physica Sinica,2003,52(3):740-744.
APA	Zhang X. T..,Xiao Z. Y..,Zhang W. L..,Gao H..,Wang Y. X..,...&Xu W..(2003).A study on photoluminescence characterization of high-quality nanocrystalline ZnO thin films.Acta Physica Sinica,52(3),740-744.
MLA	Zhang X. T.,et al."A study on photoluminescence characterization of high-quality nanocrystalline ZnO thin films".Acta Physica Sinica 52.3(2003):740-744.

条目包含的文件		下载所有文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
高质量纳米ZnO薄膜的光致发光特性研究.（57KB）			开放获取	--	浏览下载