Changchun Institute of Optics,Fine Mechanics and Physics,CAS
Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer | |
其他题名 | 论文其他题名 |
Mu Q. Q.; Liu Y. J.; Hu L. F.; Li D. Y.; Cao Z. L.; Xuan L. | |
2006 | |
发表期刊 | Acta Physica Sinica |
ISSN | 1000-3290 |
卷号 | 55期号:3页码:1055-1060 |
摘要 | Spectroscopic ellipsometry is widely used in measuring the refractive index and thickness of optical isotropic thin layers. A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced. A UVISEL spectroscopic phase modulated ellipsometer is used to measure the ordinary refractive index, extraordinary refractive index and thickness of the liquid crystal layer in a parallel-aligned liquid crystal cell. The phase retardation And is measured in transmission mode. The results show that the spectroscopic ellipsometry can be used to measure the anisotropic multilayer liquid crystal cell with high precision. |
收录类别 | SCI |
语种 | 中文 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/25733 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Mu Q. Q.,Liu Y. J.,Hu L. F.,et al. Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer[J]. Acta Physica Sinica,2006,55(3):1055-1060. |
APA | Mu Q. Q.,Liu Y. J.,Hu L. F.,Li D. Y.,Cao Z. L.,&Xuan L..(2006).Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer.Acta Physica Sinica,55(3),1055-1060. |
MLA | Mu Q. Q.,et al."Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer".Acta Physica Sinica 55.3(2006):1055-1060. |
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