Changchun Institute of Optics,Fine Mechanics and Physics,CAS
Design of Optical System for Solar Extreme-Ultraviolet Imaging Spectrometer | |
其他题名 | 论文其他题名 |
Liu Z.![]() ![]() | |
2012 | |
发表期刊 | Spectroscopy and Spectral Analysis
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ISSN | 1000-0593 |
卷号 | 32期号:3页码:834-838 |
摘要 | Hyper-spectral imaging observation of the sun in the EUV region is an important method of research for solar's upper transition region, corona and plasma's physical property. Based on the application objective of solar extreme ultraviolet imaging spectrometer(SEUIS), combined with the current states of domestic and foreign extreme ultraviolet imaging spectrometer, a few of parameters for SEUIS design were drew up in the present paper. The advantages and disadvantages of all kinds of optical configurations were discussed,and the configuration of combination of telescope and spectrometer was chosen. The available main components were also described, off-axis parabolic mirror was chosen for telescope, and a high density uniform-line-space toroidal grating for dispersion device. The optical system which satisfies the performance parameters was designed. The design process, detailed parameters and results were presented in the end. The working wavelength of the optics system is 17. 0 similar to 21. 0 nm, the field of view is 1 228 '' x1 024 '', the spatial resolution is 0. 8 arc sec . pixel(-1), the spectral resolution is about 0. 00198 nm . pixel(-1), and the total length of system is about 2. 8 m. |
收录类别 | SCI |
语种 | 中文 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/25544 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Liu Z.,Gong Y.. Design of Optical System for Solar Extreme-Ultraviolet Imaging Spectrometer[J]. Spectroscopy and Spectral Analysis,2012,32(3):834-838. |
APA | Liu Z.,&Gong Y..(2012).Design of Optical System for Solar Extreme-Ultraviolet Imaging Spectrometer.Spectroscopy and Spectral Analysis,32(3),834-838. |
MLA | Liu Z.,et al."Design of Optical System for Solar Extreme-Ultraviolet Imaging Spectrometer".Spectroscopy and Spectral Analysis 32.3(2012):834-838. |
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