HIGH-TEMPERATURE STABILITY OF A SPECTRAL HOLE BURNT IN SM-DOPED SRFCL CRYSTALS

	HIGH-TEMPERATURE STABILITY OF A SPECTRAL HOLE BURNT IN SM-DOPED SRFCL CRYSTALS
其他题名	论文其他题名
	Zhang J. H.; Huang S. H.; Yu J. Q.
	1992
发表期刊	Optics Letters
ISSN	0146-9592
卷号	17 期号:16 页码:1146-1148
摘要	A long-lived spectral hole at high temperature is observed in SrFCl:Sm. The measured hole lifetimes at 292 and 315 K are approximately 14 days and 16 h, respectively. Thermally induced hole filling is studied by using the time-decay experimental data of the hole area at different temperatures and by assuming a thermally activated process. An average thermal activation energy of 1.2 eV needed for hole filling is deduced.
收录类别	SCI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/25498
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Zhang J. H.,Huang S. H.,Yu J. Q.. HIGH-TEMPERATURE STABILITY OF A SPECTRAL HOLE BURNT IN SM-DOPED SRFCL CRYSTALS[J]. Optics Letters,1992,17(16):1146-1148.
APA	Zhang J. H.,Huang S. H.,&Yu J. Q..(1992).HIGH-TEMPERATURE STABILITY OF A SPECTRAL HOLE BURNT IN SM-DOPED SRFCL CRYSTALS.Optics Letters,17(16),1146-1148.
MLA	Zhang J. H.,et al."HIGH-TEMPERATURE STABILITY OF A SPECTRAL HOLE BURNT IN SM-DOPED SRFCL CRYSTALS".Optics Letters 17.16(1992):1146-1148.