Field-induced ionization of excited luminescent centers at high electric field strengths

	Field-induced ionization of excited luminescent centers at high electric field strengths
其他题名	论文其他题名
	Lou Z. D.; Xu Z.; Teng F.; Xu X. R.
	1997
发表期刊	Journal of Luminescence
ISSN	0022-2313
页码	112-113
摘要	In this paper we discuss the mechanism of field-induced ionization of the excited luminescent centers in rare-earth doped ZnS TFEL devices and estimate the upper-level positions of the centers according to Franz-Keldysh effect. Effects of impact and room temperature on ionization of the centers are also considered.
收录类别	SCI
语种	英语
WOS记录号	WOS:A1997XK42800039
引用统计
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/25398
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Lou Z. D.,Xu Z.,Teng F.,et al. Field-induced ionization of excited luminescent centers at high electric field strengths[J]. Journal of Luminescence,1997:112-113.
APA	Lou Z. D.,Xu Z.,Teng F.,&Xu X. R..(1997).Field-induced ionization of excited luminescent centers at high electric field strengths.Journal of Luminescence,112-113.
MLA	Lou Z. D.,et al."Field-induced ionization of excited luminescent centers at high electric field strengths".Journal of Luminescence (1997):112-113.