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Photoluminescence properties of MgxZn1-xO alloy thin films fabricated by the sol-gel deposition method
其他题名论文其他题名
Zhao D. X.; Liu Y. C.; Shen D. Z.; Lu Y. M.; Zhang J. Y.; Fan X. W.
2001
发表期刊Journal of Applied Physics
ISSN0021-8979
卷号90期号:11页码:5561-5563
摘要The photoluminescence properties of MgxZn1-xO alloy thin films fabricated by the sol-gel deposition method were studied. The Mg2+ content in the films was up to 0.36 and they had the ZnO wurtzite structure. The band gap of the films can be controlled between 3.40 and 3.93 eV by adjusting the Mg2+ proportions. Transmittance spectroscopy was used to characterize the excitonic structure of the alloys, which the excitonic character is clearly visible at room temperature. The intense ultraviolet photoluminescence was observed at room temperature. This emission is indicative of the excitonic nature of the material. (C) 2001 American Institute of Physics.
收录类别SCI
语种英语
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/25224
专题中科院长春光机所知识产出
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Zhao D. X.,Liu Y. C.,Shen D. Z.,et al. Photoluminescence properties of MgxZn1-xO alloy thin films fabricated by the sol-gel deposition method[J]. Journal of Applied Physics,2001,90(11):5561-5563.
APA Zhao D. X.,Liu Y. C.,Shen D. Z.,Lu Y. M.,Zhang J. Y.,&Fan X. W..(2001).Photoluminescence properties of MgxZn1-xO alloy thin films fabricated by the sol-gel deposition method.Journal of Applied Physics,90(11),5561-5563.
MLA Zhao D. X.,et al."Photoluminescence properties of MgxZn1-xO alloy thin films fabricated by the sol-gel deposition method".Journal of Applied Physics 90.11(2001):5561-5563.
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