The strain reduction and quality improvement in ZnO film by a 30 in-plane rotation with respect to the Al2O3 substrate

	The strain reduction and quality improvement in ZnO film by a 30 in-plane rotation with respect to the Al2O3 substrate
其他题名	论文其他题名
	Zhou S.; Wu M. F.; Yao S. D.; Lu Y. M.; Liu Y. C.
	2006
发表期刊	Materials Research Bulletin
ISSN	255408
卷号	41 期号:12 页码:2198-2203
摘要	The in-plane orientation of epitaxial ZnO thin film on Al2O3(0 0 0 1) was determined by azimuthal scan of X-ray diffraction. Comprehensive structural characterizations, including the lattice strain in perpendicular direction, the defect density, were obtained from high resolution X-ray diffraction. It's found that a 30 rotation in ZnO against Al2O3, resulting in ZnO1 1 2 0//Al2O31 0 1 0, can efficiently reduce the strain and defects in ZnO layer. Consequently, the optical property is significantly improved. 2006 Elsevier Ltd. All rights reserved.
收录类别	EI
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/24549
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Zhou S.,Wu M. F.,Yao S. D.,et al. The strain reduction and quality improvement in ZnO film by a 30 in-plane rotation with respect to the Al2O3 substrate[J]. Materials Research Bulletin,2006,41(12):2198-2203.
APA	Zhou S.,Wu M. F.,Yao S. D.,Lu Y. M.,&Liu Y. C..(2006).The strain reduction and quality improvement in ZnO film by a 30 in-plane rotation with respect to the Al2O3 substrate.Materials Research Bulletin,41(12),2198-2203.
MLA	Zhou S.,et al."The strain reduction and quality improvement in ZnO film by a 30 in-plane rotation with respect to the Al2O3 substrate".Materials Research Bulletin 41.12(2006):2198-2203.

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