CIOMP OpenIR  > 中科院长春光机所知识产出
星载成像光谱仪杂散光检测技术
张军强; 吴清文; 颜昌翔
2010-11-01
Source Publication中国光学与应用光学
ISSN1674-2915
Volume3Issue:8Pages:337-342
Abstract介绍了星载成像光谱仪杂散光检测技术在国内外的发展状况,阐述了成像光谱仪杂散光的定义、来源和危害,分析了杂散光检测的必要性。通过截止滤光片法、光谱法、谱杂散光系数法、级数透过率法、氧气吸收光谱及参数拟合法、卷积计算法和矩阵修正法等7种光谱仪器杂散光检测方法优缺点的对比,给出了星载成像光谱仪杂散光检测技术的具体要求和发展趋势,认为单一的检测技术很难满足工程研制的实际需要,针对各研制阶段的组合检测技术将是星载成像光谱仪杂光检测的发展方向。
Document Type期刊论文
Identifierhttp://ir.ciomp.ac.cn/handle/181722/22357
Collection中科院长春光机所知识产出
Recommended Citation
GB/T 7714
张军强,吴清文,颜昌翔. 星载成像光谱仪杂散光检测技术[J]. 中国光学与应用光学,2010,3(8):337-342.
APA 张军强,吴清文,&颜昌翔.(2010).星载成像光谱仪杂散光检测技术.中国光学与应用光学,3(8),337-342.
MLA 张军强,et al."星载成像光谱仪杂散光检测技术".中国光学与应用光学 3.8(2010):337-342.
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